Visible Spectrophotometer LX105VS is a single beam spectrophotometer designed with an automatic wavelength setting mode to avoid operational errors and to take quick measurements. Equipped with a bandwidth of 2 nm for peak resolution, it works on the detection of light intensity between the reference and test sample. The highly stable optics and silicon photodiode detector measure the sample and reference simultaneously optimizing the measurement accuracy.
| Optical system | Single beam, grating 1200 lines/mm |
| Wavelength range | 320nm ~ 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength accuracy | ±0.1 nm@656.1nm, ±0.3 nm@all |
| Wavelength repeatability | 0.2 nm |
| Photometric accuracy | ± 0.5 % T |
| Photometric repeatability | 0.1 % T ( 0 ~ 100% T) |
| Photometric range | 0-200%T, -0.3~3A, 0-9999C |
| Stray light | 0.05 % T@220nm, 360nm |
| Stability | ± 0.0005 A/h @ 500nm |
| Baseline flatness | ± 0.002 A |
| Noise | ± 0.001 A |
| Scanning speed | Fast, mid, slow |
| Wavelength setting | Hi, Med, Low (Max. 3000nm/min) |
| Work mode | T, A, C, E |
| Display | 320*240 LCD |
| Light Source | Imported tungsten lamp |
| Detector | Silicon photo diode |
| Cuvette holder | 10mm manual 4-cell holder |
| Data output | USB port and parallel port |
| Power | AC 220V / 50 Hz or AC 110V / 60 Hz |
| Dimension | 590 x 475 x 250 mm |
| Packaging dimension | 810 x 660 x 390 mm |
| Net weight | 20 kg |
| Gross weight | 27 kg |
Large 320*240 dots highlighted LCD for visual optimization and access to a range of functions
Wavelength (320 to 1100 nm)
Spectral Bandwidth (2 nm)
Can accommodate 5-100mm various specifications of the cuvettes
Silicon photodiode detector
Optical system- single beam 1200 lines/mm grating
Output source is USB port and parallel port
Source of light is an imported tungsten lamp
Related Products
