Table Top Spectrophotometer LX200TS is based on real-time dual optical path spectrum analysis technology which monitors the energy fluctuation and interference of light source during the measurement guaranteeing the instrument measuring accuracy and the long-term repeatability index. Equipped with an Inter-instrument agreement and provides two kinds of light sources. It adopts reflectance D/8° and transmittance D/0° geometry to measure both opaque and transparent materials with flexible fixtures to turn the camera viewfinder function for positioning measurement of small samples.
| Wavelength range |
360 nm to 780 nm |
|---|---|
| Wavelength pitch |
10 nm |
| Sensor |
Silicon photodiode array |
| Grating method |
Concave grating |
| Sphere diameter |
152 mm |
| Half bandwidth |
5 nm |
| Reflectance range |
0 to 200% |
| Resolution |
0.0001 |
| Light source |
Pulse xenon lamps and LEDs |
| UV measurement |
Including UV, 400nm cutoff, 420nm cutoff, 460nm cutoff |
| Operating temperature |
5°C to 40°C |
| Storage temperature |
20°C to 45°C |
| Relative humidity |
80% RH (at 35°C) below no condensation |
| Measurement time |
SCI/SCE < 2s (single mode) SCI+SCE < 4s |
| Measurement aperture |
Reflectance: XLAV Φ25.4mm/Φ30mm LAVΦ15mm/Φ18mm, MAVΦ8mm/Φ11mm SAVΦ3mm/Φ6mm Transmittance: Φ17mm/Φ25mm (Auto aperture size recognition) |
| Viewing angles |
2° and 10° Standard observer |
| Transmittance sample size |
No limit on sample width and height Thickness ≤ 50mm |
| Repeatability |
ΔE*ab≤0.02 Spectral reflectance/transmittance≤0.1% |
| Inter-instrument agreement |
XLAV ΔE*ab 0.25 |
| Illuminants |
A, B, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, U30, U35, DLF, NBF, TL83, TL84, ID50, ID65, LED-B1, LED-B2, LED-B3, LED-B4, LED-B5, LED-BH1, LED-RGB1, LED-V1, LED-V2 |
| Display |
Spectral data, spectral graph, chromaticity data, color difference data, color difference graph, pass/fail judgment, simulated color, color evaluation, haze, liquid chromaticity, color bias |
| Color space |
CIE LAB, CIE LUV, LCh, Hunter Lab, Yxy, XYZ, Musell, s-RGB, βxy |
| Chromatic aberration formula |
ΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc, ΔE*94, ΔE*00, ΔEab(hunter), 555 color classification |
| Chromaticity Index |
WI (ASTM E313-20, ASTM E313-73, CIE/ISO, AATCC, Hunter, Taube, Berger Stensby), YI (ASTM D1925, ASTM E313-20, ASTM E313-73) Tint (ASTM E313-20), metamerism index Milm, staining fastness, color fastness, ISO brightness, R457, A density, T density, E density, M density, APHA/Hazen/Pt-Co (platinum cobalt index), Gardner (Gardner index), Saybolt (Saybolt index), Astm color, haze total transmittance, hiding power, strength, strength |
| Lighting/light receiving system |
Reflection: d/8(diffuse lighting, 8° direction reception), transmission :d/ 0 (diffuse lighting, vertical direction reception) SCI(including specular reflected light)/SCE(not including specular reflected light) measurement at the same time Compliance with: CIE No.15, GB/T 3978, GB 2893, GB/T 18833, ISO7724/1, DIN5033 Teil7, JIS Z8722 Conditions C, ASTM E1164, ASTM-D1003-07 |
| Other functions |
Camera framing and positioning The instrument can measure sideways, upwards and downwards (with accessories) Automatic temperature and humidity compensation function |
| Interface |
USB, USB-B, RS-232 |
| Screen size |
7 inches capacitive touch screen |
| Storage memory |
8 GB U Disk for data storage and transfer |
| Power |
12V/3A |
| Dimension |
650 x 450 x 450 mm |
| Weight |
11 kg |
