Double beam Spectrophotometer LX241DS is a high sensitive double beam spectrophotometer with a wavelength of 190 to 1100 nm for absorbance spectra of chemical and biochemical compounds. It having real double beam metering and control system with latest circuit measurement which provide instrument high reliable and low noise. The highly stable optics and silicon photodiode detector measures the sample and reference simultaneously optimizing the measurement accuracy.
Optical system | Double beam, Grating 1200 lines/mm |
Wavelength range | 190 ~ 1100 nm |
Spectral bandwidth | 1 nm |
Wavelength accuracy | ±0.1nm@656.1nm, ±0.3nm@all |
Wavelength repeatability | 0.1 nm |
Photometric accuracy | ± 0.3 % T ( 0~100 % T ) |
Photometric repeatability | 0.1 % T ( 0~100 % T ) |
Photometric range | 0-200%T, -0.3~3A, 0-9999C |
Stray light | 0.05%T@220nm,360nm |
Stability | ±0.0003A/h @500 nm |
Baseline flatness | ± 0.001A |
Photometric mode | T , A , C , E |
Noise | 0.0005A@500nm |
Scanning speed | Hi, Med, Low (Max. 3000nm/min) |
Wavelength setting | Automatic |
Display | 320 x 240 mm LCD screen |
Light source | Imported deuterium & Tungsten lamp |
Detector | Imported silicon photodiode |
Cuvette holder | 10mm single hole cell holder |
Data output | Printer or USB export |
Power | AC 220 / 50 Hz or AC 110 / 60 Hz |
Dimension | 590 x 475 x 250 mm |
Packaging dimension | 810 x 660 x 390 mm |
Net weight | 20 kg |
Gross weight | 27 kg |
Large 320*240 dots highlighted LCD for visual optimization and access to a range of functions
Wavelength (190 to 1100 nm)
Spectral Bandwidth (1 nm)
Silicon photodiode detector
Built-in ARM system for high accuracy and good stability
Dual lamp system (Deuterium and Tungsten) for higher accuracy
Data export – USB / can be connected to computer and printer
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